Defect Oriented Testing for CMOS Analog and Digital Circuits

Author: Manoj Sachdev
Publisher: Springer Science & Business Media
ISBN: 9781475749267
Release Date: 2013-06-29
Genre: Technology & Engineering

Defect oriented testing is expected to play a significant role in coming generations of technology. Smaller feature sizes and larger die sizes will make ICs more sensitive to defects that can not be modeled by traditional fault modeling approaches. Furthermore, with increased level of integration, an IC may contain diverse building blocks. Such blocks include, digital logic, PLAs, volatile and non-volatile memories, and analog interfaces. For such diverse building blocks, traditional fault modeling and test approaches will become increasingly inadequate. Defect oriented testing methods have come a long way from a mere interesting academic exercise to a hard industrial reality. Many factors have contributed to its industrial acceptance. Traditional approaches of testing modern integrated circuits (ICs) have been found to be inadequate in terms of quality and economics of test. In a globally competitive semiconductor market place, overall product quality and economics have become very important objectives. In addition, electronic systems are becoming increasingly complex and demand components of highest possible quality. Testing, in general and, defect oriented testing, in particular, help in realizing these objectives. Defect Oriented Testing for CMOS Analog and Digital Circuits is the first book to provide a complete overview of the subject. It is essential reading for all design and test professionals as well as researchers and students working in the field. `A strength of this book is its breadth. Types of designs considered include analog and digital circuits, programmable logic arrays, and memories. Having a fault model does not automatically provide a test. Sometimes, design for testability hardware is necessary. Many design for testability ideas, supported by experimental evidence, are included.' ... from the Foreword by Vishwani D. Agrawal

Defect Oriented Testing for Nano Metric CMOS VLSI Circuits

Author: Manoj Sachdev
Publisher: Springer Science & Business Media
ISBN: 9780387465470
Release Date: 2007-06-04
Genre: Technology & Engineering

The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of Defect Oriented Testing for nano-Metric CMOS VLSIs lies in its industrial relevance.

Essentials of Electronic Testing for Digital Memory and Mixed Signal VLSI Circuits

Author: M. Bushnell
Publisher: Springer Science & Business Media
ISBN: 9780306470400
Release Date: 2006-04-11
Genre: Technology & Engineering

The modern electronic testing has a forty year history. Test professionals hold some fairly large conferences and numerous workshops, have a journal, and there are over one hundred books on testing. Still, a full course on testing is offered only at a few universities, mostly by professors who have a research interest in this area. Apparently, most professors would not have taken a course on electronic testing when they were students. Other than the computer engineering curriculum being too crowded, the major reason cited for the absence of a course on electronic testing is the lack of a suitable textbook. For VLSI the foundation was provided by semiconductor device techn- ogy, circuit design, and electronic testing. In a computer engineering curriculum, therefore, it is necessary that foundations should be taught before applications. The field of VLSI has expanded to systems-on-a-chip, which include digital, memory, and mixed-signalsubsystems. To our knowledge this is the first textbook to cover all three types of electronic circuits. We have written this textbook for an undergraduate “foundations” course on electronic testing. Obviously, it is too voluminous for a one-semester course and a teacher will have to select from the topics. We did not restrict such freedom because the selection may depend upon the individual expertise and interests. Besides, there is merit in having a larger book that will retain its usefulness for the owner even after the completion of the course. With equal tenacity, we address the needs of three other groups of readers.

High Performance Memory Testing

Author: R. Dean Adams
Publisher: Springer Science & Business Media
ISBN: 9780306479724
Release Date: 2006-04-11
Genre: Technology & Engineering

Are memory applications more critical than they have been in the past? Yes, but even more critical is the number of designs and the sheer number of bits on each design. It is assured that catastrophes, which were avoided in the past because memories were small, will easily occur if the design and test engineers do not do their jobs very carefully. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is based on the author's 20 years of experience in memory design, memory reliability development and memory self test. High Performance Memory Testing: Design Principles, Fault Modeling and Self Test is written for the professional and the researcher to help them understand the memories that are being tested.

A Designer s Guide to Built In Self Test

Author: Charles E. Stroud
Publisher: Springer Science & Business Media
ISBN: 9780306475047
Release Date: 2006-04-11
Genre: Technology & Engineering

A recent technological advance is the art of designing circuits to test themselves, referred to as a Built-In Self-Test. This book is written from a designer's perspective and describes the major BIST approaches that have been proposed and implemented, along with their advantages and limitations.

Advances in Electronic Testing

Author: Dimitris Gizopoulos
Publisher: Springer Science & Business Media
ISBN: 9780387294094
Release Date: 2006-01-22
Genre: Technology & Engineering

This is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on important topics which capture major research and development efforts today. "Hot" topics of current interest to test technology community have been selected, and the authors are key contributors in the corresponding topics.

Books in Print

ISBN: UOM:39015040084306
Release Date: 1970
Genre: American literature

Books in print is the major source of information on books currently published and in print in the United States. The database provides the record of forthcoming books, books in-print, and books out-of-print.


Author: Michel Wautelet
Publisher: Oldenbourg Verlag
ISBN: 3486579606
Release Date: 2008

Das von renommierten Wissenschaftlern verschiedener Fachgebiete verfasste Buch fuhrt in die physikalischen, chemischen und elektronischen Grundlagen der Nanotechnologie ein und zeigt die speziellen Fertigungstechniken und Anwendungsmoglichkeiten auf. Anhange mit kurzen Darstellungen von wichtigen Messtechniken wie Elektronenmikroskopie, Sekundarionenspektroskopie, Photoemissionsspektroskopie und kernmagnetische Resonanz (NMR) vervollstandigen das Buch."

Zuverl ssigkeit mechatronischer Systeme

Author: Bernd Bertsche
Publisher: Springer-Verlag
ISBN: 9783540850915
Release Date: 2009-02-17
Genre: Technology & Engineering

Das Buch behandelt die Zuverlässigkeitsbewertung mechatronischer Systeme – speziell in frühen Entwicklungsphasen. Herausforderung hierbei ist vor allem die ganzheitliche Betrachtung der Domänen Mechanik, Elektronik und Software sowie der unsicheren bzw. unvollständigen Daten. Neben der domänenübergreifenden Betrachtungsweise vertiefen die Autoren einzelne Themenaspekte, die der Zuverlässigkeitsbewertung in frühen Entwicklungsphasen dienen.

Diskrete Mathematik

Author: László Lovász
Publisher: Springer-Verlag
ISBN: 9783540275534
Release Date: 2006-03-30
Genre: Mathematics

Die diskrete Mathematik ist im Begriff, zu einem der wichtigsten Gebiete der mathematischen Forschung zu werden mit Anwendungen in der Kryptographie, der linearen Programmierung, der Kodierungstheorie und Informatik. Dieses Buch richtet sich an Studenten der Mathematik und Informatik, die ein Gefühl dafür entwickeln möchten, worum es in der Mathematik geht, wobei Mathematik hilfreich sein kann, und mit welcher Art Fragen sich Mathematiker auseinandersetzen. Die Autoren stellen eine Anzahl ausgewählter Ergebnisse und Methoden der diskreten Mathematik vor, hauptsächlich aus den Bereichen Kombinatorik und Graphentheorie, teilweise aber auch aus der Zahlentheorie, der Wahrscheinlichkeitsrechnung und der kombinatorischen Geometrie.Wo immer es möglich war, haben die Autoren Beweise und Problemlösungen verwendet, um den Studenten zu helfen, die Lösungen der Fragestellungen zu verstehen. Zusätzlich ist eine Vielzahl von Beispielen, Bildern und Übungsaufgaben über das Buch verteilt. László Lovász ist einer der Leiter der theoretischen Forschungsabteilung der Microsoft Corporation. Er hat 1999 den Wolf-Preis sowie den Gödel-Preis für die beste wissenschaftliche Veröffentlichung in der Informatik erhalten. József Pelikán ist Professor am Institut für Algebra und Zahlentheorie der Eötvös Loránd Universität in Budapest. Katalin Vesztergombi ist Senior Lecturer am Fachbereich Mathematik der Universität von Washington in Seattle.

GMAT f r Dummies

Author: Scott A. Hatch
Publisher: John Wiley & Sons
ISBN: 9783527642274
Release Date: 2012-02-13
Genre: Study Aids

Graut Ihnen vor dem GMAT? Keine Panik! Mit "GMAT f?r Dummies" k?nnen Sie sich systematisch auf die GMAT-Fragen einstellen und so Ihre Testpunktzahl nach oben treiben. Sie lernen, nach GMAT-Art zu denken, Texte und knifflige Korrekturaufgaben zu entschl?sseln, hervorragende Essays zu schreiben und die GMAT-Mathematikaufgaben analytisch zu l?sen. Au?erdem finden Sie in diesem Buch zwei komplette ?bungspr?fungen f?r Ihre Vorbereitung auf den Test.